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Book ID: 95707
Lafortezza, R., J. Chen, G. Sanesi and T. R. Crow (Eds.)

Patterns and Processes in Forest Landscapes. Multiple Use and Sustainable Management. 2008. illus. 455 p. gr8vo. Hardcover.

Increasing evidence suggests that the composition andspatial configuration - the pattern - of forest landscapes affect many ecological processes, including the movement and persistence of particular species, the susceptibility and spread of disturbances such as fires or pest outbreaks, and the redistribution of matter and nutrients. Understanding these issues is key to the successful management of complex, multifunctional forest landscapes, and landscape ecology, based on a foundation of island bio-geography and meta-population dynamic theories, provides the rationale to deal with this pattern-to-process interaction at different spatial and temporal scales. The book provides key insights into some of the applicable landscape ecological theories that underlie forest management, with a specific focus on how forest management can benefit from landscape ecology, and how landscape ecology can be advanced by tackling challenging problems in forest (landscape) management. It also presents a series of case studies from Europe, Asia, North America, Africa and Australia exploring the issues of disturbance, diversity, management, and scale, and with a specific focus on how human intervention affects forest landscapes and,in turn, how landscapes influence humans and their culture.
Author Lafortezza, R., J. Chen, G. Sanesi and T. R. Crow (Eds.)
Article type Titel
Author Lafortezza, R., J. Chen, G. Sanesi and T. R. Crow (Eds.)
Page image Lafortezza, R., J. Chen, G. Sanesi and T. R. Crow (Eds.): Patterns and Processes in Forest Landscapes. Multiple Use and Sustainable Management. 2008. illus. 455 p. gr8vo. Hardcover. (95707) 150.00
Manufacturer Springer Nature, KNR: 300 224 8189 Customer Service Center GmbH Kundenservice Buch
Price excl. VAT 140,19
US price excl. VAT 154,2
EAN 9781402085031
ISBN 9781402085031
Current subscription price Nein
Pitchman info Nein
 
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